Deep learning in image forgery: A systematic review for risk of bias (RoB)
Journal of Forensic Sciences [ SCIE - Q2]—peer-reviewed, Scopus/SCI

Associate Professor•Department of Computer Science & Engineering
Journal of Forensic Sciences [ SCIE - Q2]—peer-reviewed, Scopus/SCI
IEEE Transactions on Consumer Electronics [ SCIE-Q1]—peer-reviewed, Scopus/SCI
IEEE Transactions on Consumer Electronics [ SCIE-Q1]—peer-reviewed, Scopus/SCI
National Academy Science Letters [SCIE - Q2]—peer-reviewed, Scopus/SCI
Journal of The Institution of Engineers (India): Series C [SCOPUS - Q3]—peer-reviewed, Scopus/SCI
SRMIST
SRMIST
Australian Patent OFFICE
ABESEC GHAZIABAD UP