Availability Optimization of a Sensor-Based White Space System in a Data Center Using Markov Process and Metaheuristic Optimization
IEEE Sensors Journal—peer-reviewed, Scopus/SCI

IEEE Sensors Journal—peer-reviewed, Scopus/SCI
Journal of Advanced Manufacturing Systems—peer-reviewed, Scopus/SCI
National Academy Science Letters—peer-reviewed, Scopus/SCI
National Academy Science Letters—peer-reviewed, Scopus/SCI
IEEE Sensors Journal—peer-reviewed, Scopus/SCI
International Journal of System Assurance Engineering and Management—peer-reviewed, Scopus/SCI
SRM Institute of Science and Technology, Delhi-NCR Campus, Ghaziabad